Map, Bin and Test Record Management Software


ProbeCommander Wafer Map

Unique and Powerful Features: 

Composite Parameter Mapping / Binning
Like other standard mapping tools, MapCommander creates single-parameter map and bin options.  Unlike other tools, however, MapCommander also provides the ability to combine any number of single-parameter data sets into a composite map, allowing binning that is based on multiple types of measurements.

Original Data Set Retention
Instead of assigning and recording only bin numbers, MapCommander collects and retains actual wafer data, making it possible to re-classify or re-bin die at any point. 

Workstation Mode
During probing, MapCommander provides Real Time Wafer Mapping services.  After probing, MapCommander may be used to evaluate binning strategies for a given wafer on a standard workstation without being connected to a wafer probe system.

Test Result Export
MapCommander supports multiple export formats to:

  • Production equipment - MapCommander data can be exported to down-line equipment such as pick-and-place or sort systems.

  • Software applications and formats - MapCommander supports data export to the following formats:


    Summary Format

    A variety of databases

    Other formats available upon request

Effective Binning Tools
MapCommander's binning parameter properties dialog box configures:

  • Collection / retention of original data sets 

  • Composite map / binning options 

  • Bin threshold values 

  • Display colors associated with a bin 

  • Pass and fail criteria 

  • Pause after consecutive fails 

  • Reprobe setting 

  • Inker settings

MapCommander is a member of the ProbeCommander Software Suite of applications from Pacific Western System, Inc. ProbeCommander controls all of the elements of probing and testing systems - including imaging, positioning, alignment, stepping, mapping, lot, and data management services.
Copyright 2001 Pacific Western Systems, Inc.
Last Updated: March 11, 2003