Map, Bin and Test Record Management Software
ProbeCommander Wafer Map
Unique and Powerful Features:
Parameter Mapping / Binning
Like other standard mapping tools, MapCommander creates
single-parameter map and bin options.
Unlike other tools, however, MapCommander also provides the
ability to combine any number of single-parameter data sets into a
composite map, allowing binning that is based on multiple types of
Data Set Retention
Instead of assigning and recording only bin numbers, MapCommander
collects and retains actual wafer data, making it possible to
re-classify or re-bin die at any point.
During probing, MapCommander provides Real Time Wafer Mapping
services. After probing,
MapCommander may be used to evaluate binning strategies for a given
wafer on a standard workstation without being connected to a wafer
supports multiple export formats to:
equipment - MapCommander data can be exported to down-line
equipment such as pick-and-place or sort systems.
applications and formats - MapCommander supports data export to
the following formats:
Effective Binning Tools
MapCommander's binning parameter properties dialog box configures:
/ retention of original data sets
map / binning options
colors associated with a bin
and fail criteria
after consecutive fails
is a member of the ProbeCommander Software Suite of applications from
Pacific Western System, Inc.
ProbeCommander controls all of the elements of probing and
testing systems - including imaging, positioning, alignment, stepping,
mapping, lot, and data management services.